Conoscopic method for determination of main refractive indices and thickness of a uniaxial crystal cut out parallel to its optical axis

Abstract

This paper presents a simplified data acquisition and analysis technique for use in determining the main refractive indices and thickness of a uniaxial anisotropic layer cut out parallel to the optical axis, by processing the conoscopic interference figures obtained using a polarizing microscope equipped with a CCD camera. For negative uniaxial crystals, the equations used permit the calculation of the optical sign of the studied material so it is not necessary to insert a quartz wedge into the conoscopic beam. The technique can also be applied to the study of liquid crystal layers in a planar orientation.