Abstract
In order to study the statistical properties of the surface fluctuations in the Etching model more comprehensively and effectively, based on the Schramm Loewner evolution (SLE) theory, the contour lines of the saturated surface in the (2+1)-dimensional Etching model are investigated by means of numerical simulations. Results show that the isoheight lines of the (2+1)-dimensional Etching surfaces are conformally invariant and can be described in the frame work of the SLE theory with diffusivity =2.70 0.04, which belongs to the =8/3 universality class. The corresponding fractal dimensions of the isoheight lines are df =1.34 0.01.
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