Confocal optical beam induced current microscopy of light-emitting diodes with a white-light supercontinuum source

Abstract

To improve the efficiency of confocal optical beam induced current (OBIC) and the non-destructive, high-resolution analysis of semiconductor media we report the application of a white-light supercontinuum laser source capable of confocal OBIC across a wide spectral range. To demonstrate the capability of this source, we performed confocal OBIC of light emitting diodes with varying absorption and emission properties in the visible spectrum. Using the wavelength flexibility afforded by the broadband laser source, we were able to determine and apply the optimum excitation wavelength range for efficient confocal OBIC instead of applying inferior fixed wavelength laser sources.