Abstract
A confocal full-field X-ray microscope has been developed for use as a novel three-dimensional X-ray imaging method. The system consists of an X-ray illuminating ;sheet-beam' whose beam shape is micrified only in one dimension, and an X-ray full-field microscope whose optical axis is normal to the illuminating sheet beam. An arbitral cross-sectional region of the object is irradiated by the sheet-beam, and secondary X-ray emission such as fluorescent X-rays from this region is imaged simultaneously using the full-field microscope. This system enables a virtual sliced image of a specimen to be obtained as a two-dimensional magnified image, and three-dimensional observation is available only by a linear translation of the object along the optical axis of the full-field microscope. A feasibility test has been carried out at beamline 37XU of SPring-8. Observation of the three-dimensional distribution of metallic inclusions in an artificial diamond was performed.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
