Configurable dual-topological-interface-states induced reflection in hybrid multilayers consisting of a Ge2Sb2Te5 film

Abstract

Active control of induced reflection is crucial for many potential applications ranging from slowing light to biosensing devices. However, most previous approaches require patterned nanostructures to achieve controllable induced reflection, which hinders their further applications due to complicated architectures. Herein, we propose a lithography-free multilayered structure to achieve the induced reflection through the coupling of dual-topological-interface-states. The multilayers consist of two one-dimensional (1D) photonic crystals (PCs) and an Ag film separated by a Spacer, topological edge state (TES) and topological Tamm state (TTS) can be excited simultaneously and their coupling induces the reflection window. The coupled-oscillator model is proposed to mimic the coupling between the TES and TTS, and the analytical results are in good agreement with finite element method (FEM). In addition, the TES-TTS induced reflection is robust to the variation of structural parameters. By integrating an ultra-thin phase-change film of Ge2Sb2Te5 (GST) into the multilayers, the induced reflection can be switched through the phase transition of the GST film. The multipole decomposition reveals that the vanished reflection window is arising from the disappearance of TTS associated with the toroidal dipole (TD) mode.