Abstract
A general formula for data analysis in conductometric experiments on latent track structure has been obtained without any pore shape assumption. An iterative equation, which was derived from pore geometry defined in a rest frame model, enables us to estimate the precise pore shape of the latent tracks during an etching. Polyethylene terephthalate (PET) films irradiated by Kr ions have been studied by this iteration technique. Radial etch rates reach convergence after a few iteration cycles and are less affected by the error of the breakthrough time. The iteration technique also reveals that a cylinder approximation, which is widely used for calculating a pore size, overestimates the transverse size of etched heavy ion tracks in the range less than 10 nm.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
