Abstract
There is much interest in interfaces between insulating oxides, such as SrTiO3 (STO) and LaAlO3 (LAO), where a two dimensional electron gas can form due to the so-called polar discontinuity. These interfaces are mostly fabricated by Pulsed Laser Deposition (PLD). We have investigated such interfaces by reactive RF sputtering in a high-pressure oxygen atmosphere. The films are smooth and crystalline. Transmission Electron Microscopy indicates that the interfaces are sharp and continuous while Electron Energy Loss Spectroscopy data indicate some slight intermixing. However, we find these interfaces to be non-conducting. It appears that the sputtered interface is not electronically reconstructed in the way reported for films grown by PLD, notwithstanding the good structural quality and composition of the films
Highlights
The physics behind the formation of a two dimensional electron gas at the interfaces of the band insulators LaAlO3 and SrTiO3 is still subject to an ongoing debate even eight years after its discovery [1]
There is much interest in interfaces between insulating oxides, such as SrTiO3 (STO) and LaAlO3 (LAO), where a two dimensional electron gas can form due to the so-called polar discontinuity
Transmission Electron Microscopy indicates that the interfaces are sharp and continuous while Electron Energy Loss Spectroscopy data indicate some slight intermixing
Summary
Hesselberth Kamerlingh Onnes Laboratorium, Leiden University, The Netherlands, Q. There is much interest in interfaces between insulating oxides, such as SrTiO3 (STO) and LaAlO3 (LAO), where a two dimensional electron gas can form due to the so-called polar discontinuity. These interfaces are mostly fabricated by Pulsed Laser Deposition (PLD). Transmission Electron Microscopy indicates that the interfaces are sharp and continuous while Electron Energy Loss Spectroscopy data indicate some slight intermixing. We find these interfaces to be non-conducting.
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