Abstract

We derive high-order terms in the asymptotic expansions of boundary perturbations of steady-state voltage potentials resulting from small perturbations of the shape of a conductivity inclusion with C 2 {\mathcal C}^2 -boundary. Our derivation is rigorous and based on layer potential techniques. The asymptotic expansion in this paper is valid for C 1 {\mathcal C}^1 -perturbations and inclusions with extreme conductivities. It extends those already derived for small volume conductivity inclusions and leads us to very effective algorithms for determining lower-order Fourier coefficients of the shape perturbation of the inclusion based on boundary measurements. We perform some numerical experiments using the algorithm to test its effectiveness.

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