Conductive micro-bead array detection by high-frequency eddy-current testing technique with SV-GMR sensor

S Yamada,K Chomsuwan,M Iwahara,T Hagino,H Tian

doi:10.1109/intmag.2005.1463638

S Yamada, K Chomsuwan + Show 3 more

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https://doi.org/10.1109/intmag.2005.1463638

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Publication Date: Jan 1, 2005
Citations: 8	License type: cc-by-nc-nd

Affiliation: Kanazawa University, Chongqing University

Abstract

Applying of eddy-current testing (ECT) probe with spin-valve giant magnetoresistive (SV-GMR) sensor to high frequency excitation provides the feasibility of micro-defect detection for example high-density printed circuit board inspection. In this paper, the detection of conductive micro-bead with 250 to 760 /spl mu/m diameter, and its feasibility are discussed. The analytical model is discussed and compared with experimental results to verify that the proposed technique is able to detect conductive micro-bead.

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