Abstract
An improved second-order artificial material single-layer (AMSL) method is proposed to predict the electromagnetic field in the presence of conductive thin layers by the finite-element method (FEM). The AMSL method is based on the replacement of the material physical constants of a conductive shield region with those of an artificial material. The new AMSL physical constants are analytically extracted by equating the equivalent transmission line equations governing the field propagation inside the shield with the FEM solution. This new formulation of the method is a significant improvement of the original AMSL as it is much more robust and accurate for near field solutions, and, above all, it is much more easily implementable in commercial software tools.
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