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ADVERTISEMENT RETURN TO ISSUEPREVCommunicationNEXTConduction and Valence Band Edges of Porous Silicon Determined by Electron TransferJulie M. Rehm, George L. McLendon, and Philippe M. FauchetView Author Information Department of Chemistry, University of Rochester Rochester, New York 14627 Department of Chemistry, Princeton University Princeton, New Jersey 08544 Department of Electrical Engineering and Department of Physics & Astronomy University of Rochester, Rochester, New York 14627 Cite this: J. Am. Chem. Soc. 1996, 118, 18, 4490–4491Publication Date (Web):May 8, 1996Publication History Received20 November 1995Revised12 February 1996Published online8 May 1996Published inissue 1 January 1996https://doi.org/10.1021/ja9538795Copyright © 1996 American Chemical SocietyRIGHTS & PERMISSIONSArticle Views621Altmetric-Citations53LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InReddit Read OnlinePDF (145 KB) Get e-AlertsSupporting Info (2)»Supporting Information Supporting Information SUBJECTS:Aromatic compounds,Electrical conductivity,Energy,Hydrocarbons,Redox reactions Get e-Alerts

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