Abstract
The basic electromagnetic compatibility (EMC) problem is very simple to describe at a high level, as shown, where the elementary EMC problem breaks down into a source, a path and a victim. Ensuring EMC needs a good understanding of all three aspects. Sources can be further subdivided into continuous and transient sources and the pathway splits into radiated and conducted coupling. This paper primarily concentrates on the conducted aspects and in particular how we test to ensure equipment has adequate conducted EMC performance.
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