Abstract
Since the development of the scanning tunneling microscope (STM) [1] it is not only possible to see, but also to manipulate and to measure the transport properties of individual atoms on surfaces [2]. By energy dependent measurements of the differential conductance a certain chemical information can be achieved [3]. The challenging aim of building up electronic circuits atom by atom with tailor-made properties, however, would require the detailed knowledge of the relation between the physical and chemical properties of the respective atoms and their conduction properties, a problem which has been addressed by different methods during the last years [4, 5, 6]. The most simple system for all investigations - including the present - is a one-atom contact between two metallic banks of the same element.
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