Abstract
Near-field coupling effect in the narrow gaps between two metallic probes strongly enhances the electromagnetic field. In this paper, we design and implement a concurrent scanning double-tip-enhanced Raman scattering (CS-TERS) system, which can strongly enhance the tip-enhanced Raman scattering (TERS) enhancement factor without the restriction on the sample height. We use finite-difference time domain (FDTD) simulations to study the enhancement properties of double-tip-enhanced Raman scattering and then discuss the tip taper angle dependence of the TERS enhancement. The obtained results show that the proposed CS-TERS system can be implemented without the near-field coupling effect between the metal tip and the metal substrate; thus, the height of the measured sample will be greatly enlarged and the application of TERS method will be expanded.
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