Abstract
An automated technique for concurrent application of Differential Thermal Analysis (DTA) and Dynamic Dielectric Analysis (DDA) is described. Two modes of operation of DDA are discussed: Mode A allows monitoring of the ac electrical properties of the test sample over a continuous range of frequencies from 50 Hz to 1 MHz at selected temperatures whereas Mode B facilitates examination of the dielectric behavior over a continuous range of temperatures from room temperature to 800/sup 0/C at selected frequencies. The complementary nature of information obtained from Mode A and Mode B and the concurrent application of DDA and DTA are illustrated for the crystal structure transformation in potassium perchlorate. 10 figures, 2 tables.
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