Abstract
A method for analyzing spoof SPPs on a periodically corrugated surface has been presented. Compared to the previous works, our approach enables us to investigate the semiconductor case, since it takes into account the permittivity of the semiconductor expressed by the Drude model. In the THz frequency range, the properties of the dispersion and loss of spoof SPPs on corrugated Si surfaces have been analyzed. The asymptotic frequency of spoof SPPs mainly depends on the groove depth, but the loss of spoof SPPs is sensitive to all parameters of the surface structure, including the lattice constant. However, the performance of low–loss propagation for spoof SPPs can be achieved by an optimum design of the surface structure.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
