Abstract
A Physics of Failure approach provides a basis for modeling of connector degradation mechanisms. Such a modeling capability can be realized, with differing levels of complexity, for many important connector degradation mechanisms. However, extension of this modeling capability to modeling of connector reliability is far more complicated and, in fact, questionable. Reliability modeling of connectors requires knowledge of the relationship between degradation mechanisms and connector performance parameters such as contact resistance. The required relationships, however, are not straightforward in that some of the key parameters are design and application dependent. This dependence makes a general reliability modeling approach difficult at best. This paper highlights some of these design/application dependencies in terms of a proposed general model of contact resistance degradation and, therefore, contact reliability modeling. The conclusion reached is that, at this point, connector modeling has its major value in identifying and quantifying laboratory exposure environments and procedures directed towards assessing connector reliability empirically.
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