Abstract
X-ray photoelectron spectroscopy (XPS) C(sub 1s) spectra of fluoropolymers exposed to either an argon plasma or argon ion beam show remarkable similarity, implying that the surface-modification reactions for these two processes likely proceed through comparable mechanisms, revolving predominantly ion-surface interactions. The importance of working with a monochromatized x-ray source for XPS analysis of the surface-modified fluoropolymers is once again emphasized.
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