Abstract
Y2SiO5 (YSO) single crystals with various Ce concentrations were fabricated and their photoluminescence (PL) and optically stimulated luminescence (OSL) properties analyzed. From the evaluation of PL properties, there was an emission band centered at 420 nm in Ce:YSO samples. The observed emission originated from the 5d-4f transitions of Ce3+ ions. In OSL properties, OSL spectra under stimulation at 520 nm exhibited emission peaks at 420 nm, and the emission origin was also the 5d-4f transitions of Ce3+ ions. The OSL dose response functions had a lower detection limit of 1 mGy for the 0.5 and 1.0% Ce:YSO samples, and 10 mGy for the 0.1 and 2.0% Ce: YSO samples. The OSL intensity of the 1.0% Ce:YSO sample was approximately 69.3% after 24 h from X-ray irradiation compared to immediately after X-ray irradiation.
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