Concentration and Size Effects in Electrophysical Properties of Thin Films Based on Permalloy and Silver

I M Pazukha,M S Оvrutskyi,D O Shuliarenko,L V Odnodvorets,O V Pylypenko

doi:10.15330/pcss.21.2.238-242

I M Pazukha, M S Оvrutskyi + Show 3 more

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https://doi.org/10.15330/pcss.21.2.238-242

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Abstract

Complex study of electrophysical properties (the electrical resistivity r and the temperature coefficient of resistance (TCR) b) of thin-film samples based on ferromagnetic alloy Ni80Fe20 (permalloy) and noble metal Ag in a wide composition range and within the range of thickness 20-100 nm done. Thin films were obtained by the method of electron-beam co-evaporation technique at room temperature. Their composition was investigated using the method of X-ray spectrometry. The phase state was analyzed by the electron diffraction method. It was demonstrated that the crystal structure of thin films stays unchanged during the annealing process to 500 K. The size and concentration dependences of r and b values were obtained. The corresponding maximum and minimum at the concentration of Ag atoms of 50-60 at.% observed at the dependences r(cAg) and b(cAg). Size dependences r(d) and b(d) associated with the size effects in thin-film materials.

Highlights

Magnetoresistive properties of the ferromagnetic/nonmagnetic thin-film systems are studied intensively by many researchers [1,2,3,4]
The purpose of this paper is the investigation of the concentration and size effects in electrophysical properties of thin films based on ferromagnetic alloy Ni80Fe20 and Ag
To analyze the concentration and size effects in the electrophysical properties of thin films based on Py and Ag, it is important to know of their crystal structure in as-deposited and annealed states

Summary

Introduction

Magnetoresistive properties of the ferromagnetic/nonmagnetic thin-film systems are studied intensively by many researchers [1,2,3,4] In these systems, the direction of conducting electrons movements depends on the direction of the applied magnetic field. The previous study revealed that the magnitude of the GMR effect depends on technological parameters (vacuum conditions, condensation speed, substrate temperature, etc.), and type of the magnetic systems (multilayer, spin-valve or granular alloy). These allow expands a range of ferromagnetic/nonmagnetic systems applications for electronic systems [7, 8]. The purpose of this paper is the investigation of the concentration and size effects in electrophysical properties of thin films based on ferromagnetic alloy Ni80Fe20 (permalloy) and Ag

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