Abstract
Using a personal computer, electron and x-ray diffraction patterns are analytically generated and printed to scale. The structure factor equation is used to determine which crystalline planes diffract according to the supplied crystal lattice type, atoms present and their positions in the unit cell, lattice dimension(s), crystal orientation, and radiation wavelength. Single crystal spot and Kikuchi electron diffraction patterns as well as polycrystalline ring patterns can be generated. Powder x-ray diffraction patterns are also generated using this code. Complex composite patterns are generated by overlaying multiple patterns resulting from crystallographic orientation effects. A user friendly program with a direct approach to generate diffraction patterns for any defined crystal aids in the analysis and indexing of these patterns.
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