Abstract
ABSTRACT Fractional thermoluminescence (FTh) is computer simulated using a model of an insulator with three kinds of activetraps and one kind of recombination centre. The trap depth values are determined from the calculated FTh curve using Gobrecht and Hofmann method modified by Chrucinska. The method yields the correct trap energy spectrum if the thermoluminescence curve having weakly overlapping peaks is analysed. The trap depths determined with this methodhave values lower by about 10 to 25 % than those used for the calculations.Keywords: thermoluminescence, fractional glow technique, trap energy spectrum. 1. INTRODUCTION The method of determination of trap energy spectrum in insulators and semiconductors, called the fractional glowtechnique (FGT), was developed by Gobrecht and Hofmann' . In this method the multipeak thermoluminescence (ii)curve is analysed by cyclically repeated heating and cooling of the sample. It is assumed that the temperature dependenceof TL intensity during heating and cooling is described by the relation2
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