Abstract
The possibilities and limitations of HREM for evaluating structural details in amorphous silica were investigated by computer simulation. The calculated defocus series of HREM images for an unstrained and a linearly strained network model of vitreous SiO 2 have shown that microvoids, density fluctuations as well as strained regions can be interpretably imaged for thin specimens ( t < 5 nm).
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
