Abstract
A computer simulator has been constructed which can be used to model the operation of current-activated gates used in ion-implanted magnetic bubble devices. Input parameters for the simulator include the geometry of the implanted patterns, magnetic characteristics of the bubble film, implanted layer thickness, conductor geometry, amplitude and phase of currents in conductors, and the frequency and amplitude of the drive field. The forces that act on the bubble are computed, and the resultant bubble wall motion is computed. The operation of various gates for ion-implanted devices has been analyzed. Simulation of propagation on ion-implanted patterns has been performed, and the predicted failure modes are the same as those observed in experimental devices. The simulated bias margins of both propagation and gate operation correspond well with experimentally obtained margins. >
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