Abstract
The possibility of chaotic behavior of the current in a partially compensated semiconductor during low-temperature electrical breakdown is explored by computer simulation. The influence of random fluctuations in the parameters or the variables of the mathematical model, as well as the effect of some weak periodic disturbances of the current density in the semiconductor, are discussed. As a result, various pictures of chaotic oscillations of the current are obtained, including a transition to a chaotic regime through period doubling, which is characteristic of the Feigenbaum scenario.
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