Computer-controlled scattering measurements in a parallel-plate configuration

Abstract

Describes an instrument developed for the purpose of studying the propagation of microwaves through and scattered by objects of varying dielectric properties. It is hoped that a map of the internal electromagnetic structure of the object can be reconstructed from the measurement of the amplitude and/or the phase of the fields outside the object. For this purpose, the field is sampled at a large number of points under minicomputer control. The geometry of the problem is simplified by performing the measurements in a parallel-plate configuration. The minicomputer controls the data acquisition, storage of the data, and data display. A description of the hardware and software components of the system is presented, its performance is illustrated with measured distributions for some object geometries.