Abstract
This study investigated the scattered transverse-magnetic (TM) electromagnetic field from a truncated semi-elliptic embedded in a perfectly electric conducting plane. Boundary value analysis and the region-point-matching technique are employed to address the issues considered. The analyzed region is divided into three sub-regions, after which the tangential fields are expanded in terms of Mathieu functions into two different coordinate systems. By applying boundary conditions at two auxiliary boundaries and using the region-pointmatching technique, several independent equations are constructed and subsequently simplified to generate a system of linear equations. For the validation of the obtained results, the suggested procedure is compared to the method of moment. Finally, the effects of cavity depth and incident angle on the scattering signature are inspected.
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