Abstract
Short-term flicker severity (P/sub st/) is an important electric power quality index defined by the International Electrotechnical Commission (IEC). P/sub st/ results from the statistical evaluation of flicker over short periods of time producing an objective measure for flicker originating from various types of sources. This paper reviews previous methods for computing P/sub st/ and proposes a new iterative algorithm. The algorithm is computationally efficient and shown to comply with the IEC standard.
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