Abstract
In magnetic force microscopy (MFM), a sharp magnetic needle interacts with the field pattern established by the sample near its surface. A cantilever then converts the force on the needle to a displacement, which is measured interferometrically or otherwise. The author describes a model for the tip that takes full account of the micromagnetic interactions involved. The stray magnetic field for a thin film is computed, and the micromagnetic model of the needle is developed. An example calculation is given to illustrate the application of the model.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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