Abstract

In this paper a method for computing the capacitance matrix of a multiconductor interconnect line in a multilayered dielectric region is presented. The number of conductors and dielectric layers are arbitrary. The conductors are infinitesimally thin, and can be placed anywhere in the structure. The formulation is obtained by using a semi-analytic Green's function for multilayer structures, which is integrated to a series expansion, valid for uniform charge distribution on the conductors. In addition, the quasi-analytical evaluation of the entries of the Galerkin matrix leads to a very efficient and accurate computer code. Computed results are given for some cases of the integrated circuit interconnects to show the advantages and simplicity of our procedure as compared to the methods available in the literature.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.