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Abstract
The electron-impact energy-loss spectrum of He at a scattering angle of 7\ifmmode^\circ\else\textdegree\fi{} has been measured with an energy resolution of 2.7 eV full width at half-maximum using 25-keV incident electrons. A binary-encounter approximation was used to obtain the electron Compton profile from the cross-section differential with respect to both the energy loss of the incident electron and solid angle of the scattered electron $\frac{{d}^{2}\ensuremath{\sigma}}{\mathrm{dEd}\ensuremath{\Omega}}$. The electron Compton profile was corrected for interference scattering from pairs of target electrons and exchange. It was then compared to theoretical and x-ray experimental values for the Compton profile. The effects of background, multiple scattering, and energy resolution are discussed. The electron-impact and x-ray methods for measuring Compton profiles are compared.
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