Abstract
So-called ion Compton profiles can be obtained if the recoiling electron after an inelastic ion-electron encounter is observed and energy analyzed. Electron recoil spectra induced by 21 MeV protons passing through thin Ag and Au foils are measured. It is demonstrated that the method is accurate enough to extract valence Compton profiles of Ag and Au from the data. The advantages and disadvantages compared to inelastic λ- or electron-electron scattering are discussed. It turns out that this new method for the measurement of Compton profiles is especially suitable for heavy elements and very thin or small targets (e.g. clusters).
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have