Compton profiles by inelastic ion-electron scattering

Abstract

It is shown that Compton profiles (CP) can be measured by inelastic ion-electron scattering. Within the impulse approximation the binary-encounter peak (BEP) reflects the CP of the target atom whereas the electron-loss peak (ELP) is given by projectile CP's. Evaluation of experimental data reveals that inelastic ion-electron scattering might be a promising method to supply inelastic electron or photon scattering for the determination of target CP's. The measurement of projectile CP's is unique to ion scattering since one gains knowledge about wave-function effects because of the high excitation degree of fast heavy-ion projectiles.