Abstract
X-Ray Fluorescence (XRF) scanning is a widespread technique of high importance and impact since it provides chemical composition maps crucial for several scientific investigations. There are continuous requirements for larger, faster and highly resolved acquisitions in order to study complex structures. Among the scientific applications that benefit from it, some of them, such as wide scale brain imaging, are prohibitively difficult due to time constraints. However, typically the overall XRF imaging performance is improving through technological progress on XRF detectors and X-ray sources. This paper suggests an additional approach where XRF scanning is performed in a sparse way by skipping specific points or by varying dynamically acquisition time or other scan settings in a conditional manner. This paves the way for Compressive Sensing in XRF scans where data are acquired in a reduced manner allowing for challenging experiments, currently not feasible with the traditional scanning strategies. A series of different compressive sensing strategies for dynamic scans are presented here. A proof of principle experiment was performed at the TwinMic beamline of Elettra synchrotron. The outcome demonstrates the potential of Compressive Sensing for dynamic scans, suggesting its use in challenging scientific experiments while proposing a technical solution for beamline acquisition software.
Highlights
X-ray Fluorescence (XRF) spectroscopy and imaging are well established techniques used in a wide range of scientific applications[1,2,3]
A visual example of the described method is presented in Fig. 1, where a standard X-Ray Fluorescence (XRF) map (Fig. 1d), in this case of Silicon, acquired point by point in a regular square scan on a foraminifera shell is compared with the same scan acquired with the proposed approach (Fig. 1e), based on a mask (Fig. 1b) defined from a previously acquired absorption image (Fig. 1a), and reconstructed to resemble a full one
This paper suggests a series of methods for performing XRF scans in dynamic ways
Summary
X-ray Fluorescence (XRF) spectroscopy and imaging are well established techniques used in a wide range of scientific applications[1,2,3]. If the acquisition is based on sparse and compressive sensing approaches such those this paper is proposing (case c), the total measurement can become feasible This manuscript suggests reduced and selective ways for acquiring LEXRF maps, which can be obviously applied to any energy range. It is based on Compressive Sensing[11,12] which is an emerging and very effective technique for reconstruction from a relatively small number of data samples without compromising the imaging quality; in our case it allows performing scans of a dynamic nature where it is possible to skip points (sparse) and acquire with variable parameters (i.e. acquisition time). The used detector system is based on a 8 SDD setup[14,15] with a novel multi-channel analyser[16] (DANTE digital pulse processor, XGLab Bruker)
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