Abstract
A novel glass system B2O3–SiO2–Bi2O3–TeO2–BaO–ZnO doped with Eu2O3 (x = 0–4 mol%) is fabricated through melt-quench technique and coded as BiTeEu-x. Density and refractive index measurements done on the glasses resulted in the increase up to 5.4377 gcm−3 and 1.99, respectively, for 4 mol% addition of Eu2O3. Vickers micro-indentation measurements done on synthesized glasses gave increasing microhardness values with Eu3+ doping due to higher bond strength of Eu–O bond compared to Te–O bond. The Phy-X/PSD simulation software utilized for obtaining radiation shielding parameters produced highest range of mass attenuation coefficient (63.878–0.036 cm2/g) and lowest range of half-value layer (0.002–3.551 cm) for the same glass proving its superiority in radiation attenuating capacity. This article addresses the theoretical analysis of photon buildup occurring inside the fabricated glasses in 0.015–15 MeV energy range with respect to different penetration depths. Neutron shielding ability of BiTeEu-4 glass was found to be impressive with fast neutron removal cross section (FNR) value of 0.10362 cm−1.
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