Abstract
Product reliability investigations typically include accelerated humidity testing. Originally, the “standard” test was a biased 85 °C/85% relative humidity (RH) lifetest for 1000 h. Recently, a substitute accelerated version of this test has been used. The accelerated version is called highly accelerated stress test (HAST). The HAST conditions are also biased, at 130 °C, 85%RH, and approximately 18 PSI overpressure. The duration of the HAST test is normally 96–100 h – to be equivalent to the 85/85 test. This study is intended to investigate thermal acceleration and show that equivalent HAST tests on compound semiconductors are more highly accelerated and could be conducted with much shorter durations.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
