Abstract
Nanostructured fullerene films of controlled surface topography have been prepared by electrophoretic deposition from toluene−ethanol mixed solvent solutions. Atomic force microscopy (AFM) imaging of the films revealed that the size of the C60 grains could be readily controlled by the time of C60 aggregation in bulk solution before deposition and by the strength of the dc electric field applied during the deposition. The deposition was monitored by piezoelectric microgravimetry with the use of an electrochemical quartz crystal microbalance. The mass of the C60 film increased exponentially with the time of deposition. The corresponding decrease of the deposition rate with time was presumably due either to the growth of larger C60 aggregates in solution of lower mobility or blocking effect of the electrode surface by insulating C60 deposits. In the accessible potential window of 0.1 M (TBA)PF6, in acetonitrile, cyclic voltammetry (CV) curves for the C60 films featured four cathodic peaks corresponding to fo...
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