Abstract

A high resolution new fringe analysis method for ESPI with only one camera is proposed by using features of speckle interferometry in deformation process. The profile of intensity of each speckle of speckle patterns in the deformation process is analyzed by Hilbert transformation. A virtual speckle pattern for creating a carrier fringe image is produced artificially. The deformation map can be detected by the virtual speckle pattern in the operation based on spatial fringe analysis method. Experimental results show that the difference between the results by the new and the ordinary methods is less than 0.12 rad as standard deviation.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.