Abstract
Based on recent discoveries, we introduce a method to project a single structured pattern onto an object and then reconstruct the three-dimensional range from the distortions in the reflected and captured image. Traditional structured light methods require several different patterns to recover the depth, without ambiguity or albedo sensitivity, and are corrupted by object movement during the projection/ capture process. Our method efficiently combines multiple patterns into a single composite pattern projection allowing for real-time implementations. Because structured light techniques require standard image capture and projection technology, unlike time of arrival techniques, they are relatively low cost.
Highlights
Structured-light illumination [1] is a commonly used technique for automated inspection and measuring surface topologies
We have discovered a systematic way of generating such patterns, by combining multi-patterns into a single Composite Pattern (CP) that can be continuously projected
We present a general methodology to combine traditional multi-frame SL patterns into a single composite pattern
Summary
Structured-light illumination [1] is a commonly used technique for automated inspection and measuring surface topologies. The individual patterns are spatially modulated along the orthogonal dimension, perpendicular to the phase dimension In this way we can take advantage of the existing procedure for traditional multiple patterns such as Phase Measuring Profilometry (PMP) [5], Linearly Coded Profilometry (LCP) [7], and other multi-frame techniques [15, 16] while only projecting one single frame onto the target object. This composite modulation approach is fit for most of the successive projection patterns. The depth of the object can be reconstructed out of the phase following the traditional PMP method
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