Abstract

We have measured the temperature dependence of the complex refractive index, specific heat capacity, and thermal conductivity of crystalline Sb–Te alloys and ZnS–SiO2 with various compositions by using a spectroscopic ellipsometer, differential scanning calorimeter, and nanosecond pulsed light heating thermoreflectance system. The temperature range was set from room temperature to several hundred degrees Celsius. The values of these properties are useful for calculating realistic temperatures in memory devices and for designing device structures.

Full Text
Paper version not known

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call