Abstract

The objective of this paper is to extract and study the complex permittivity of the FeSiAl/Al2O3 ceramic composite at X-band frequencies. We studied by simulation the complex permittivity of four composites with FeSiAl content varying from 0% to 15% by volume in the alumina matrix. The influence of the FeSiAl content on the complex permittivity of the FeSiAl / Al2O3 composite was also studied. The results obtained show on the one hand that the complex permittivity depends on the frequency. Indeed, the values of the real and imaginary parts of the complex permittivity decrease with the increase in frequency over the entire frequency range in the X band. On the other hand, the high FeSiAl content has a significant impact on the values of the real and imaginary parts of complex permittivity. Higher values were obtained for composites with a high inclusion content. In this work, we obtained a good agreement between the simulation results and the published experimental results. These results indicate that the FeSiAl / Al2O3 composite can be used in applications as an electromagnetic wave absorbing material.

Highlights

  • IntroductionGreat importance has been given to the study of ceramic composite materials

  • In recent years, great importance has been given to the study of ceramic composite materials

  • We extracted the complex permittivity of the FeSiAl / Al2O3 ceramic composite in the X-band

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Summary

Introduction

Great importance has been given to the study of ceramic composite materials. Due to the higher dielectric properties and excellent microwave absorption properties possessed by these materials, they have been used in devices absorbing waves emitted by radars RAM [6], in electronic equipment, mobile communications [7], aircraft stealth technology and electromagnetic interference protection [8]. The use of materials in applications requires accurate knowledge of the complex permittivity [9]. Several methods have been used for the extraction of the complex permittivity of materials [9]. The transmission/reflection method (T/R) is the most adopted in the characterization of microwave materials [10, 11], due to its wide frequency band characterization

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