Abstract
This paper describes a novel method of characterizing complex permittivity using a complementary frequency selective surface (CFSS). The CFSS provides a passband behavior and the change in the passband when a material under test (MUT) is placed adjacent to the CFSS has been used for retrieving of the complex permittivity of the MUT. The complex permittivity of the MUT are determined based on the measured bandpass resonant frequency and insertion loss of the CFSS with the MUT. This is an amplitude-only method where phase measurements are not required. This technique offers a convenient, fast, low-cost and nondestructive measurement that is not restricted by the sample size or shape.
Highlights
A material that has the capability of storing energy when there is an external electric field applied is classified as dielectric
The dielectric constant of the material under test (MUT) is determined by the bandpass resonant frequency when the MUT is placed next to the complementary frequency selective surface (CFSS) and the loss tangent is obtained from the measured insertion loss magnitude
In order to ensure the CFSS structure operated at the desired resonant frequency, simulations were carried out to investigate the effect of the CFSS parameters on the bandpass resonant frequency
Summary
A material that has the capability of storing energy when there is an external electric field applied is classified as dielectric.
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