Abstract
It is shown theoretically for the first time that the complex impulse response (IR) of a bandwidth-limited optical device can be measured by having a tunable source for an amplitude-sensitive optical low coherence reflectometry. Systematic errors in the measurement technique are quantified through numerical simulations for fiber gratings and arrayed waveguide gratings. The errors are expected to be as low as 1/spl deg/ for phase, 0.5% for amplitude of the IR.
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