Abstract
Titanium dioxide (TiO2) ceramics with various grain sizes were investigated by impedance spectroscopy techniques. Dielectric loss peak identified in coarse grain TiO2 was attributed to space charge polarization occurring at the grain boundaries. Electric modulus representation of the impedance data showed two types of relaxation processes in coarse grain TiO2, whereas only one type was observed in fine grain TiO2. Long‐range migration of oxygen vacancies was found to be the dominant conduction mechanism for fine grain TiO2, while electron hopping between localized states was attributed to dielectric relaxation in coarse grain TiO2.
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