Complex conductivity-dependent two-dimensional atom microscopy

Abstract

A two-dimensional atom microscopy is investigated using the absorption spectrum under the effect of complex conductivity in a four-level inverted N-type atomic system. Sharp localized peaks are noticed in one wavelength domain in 2D inverse space $ -\pi\leq kx\leq\pi$ and $ -\pi\leq ky\leq\pi$. Four, three, two and even single localized peaks having high precise position, minimum uncertainty and significant probability are measured in the proposed model. The localized probability is enhanced or degraded with the application of complex conductivity. The phase and amplitude of complex conductivity significantly influence the atom microscopy for useful technological applications. The results may be helpful to advance laser cooling and trapping.