Abstract
The combination of various 2D layered materials in multilayer heterostructures arises great interest in the current science. Due to the large variety of electronic properties of the group of 2D layered materials the combination opens a new pathway towards ultrasmall electronic devices. In this contribution we present a full mathematical description of multilayer heterostructure samples and their diffraction patterns including a proposal of a consistent assignment of the superstructure diffraction spots. A 27nm thick MoS2–graphite heterostructure was produced and fully analysed with the methods presented in this paper.
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