Abstract
Complementary neutron and synchrotron X-ray scattering techniques have been considered as applied to the investigation of an inhomogeneous magnetic microstructure typical of exchange-coupled nanoheterostructures consisting of alternating ferromagnetic and antiferromagnetic metal layers. It has been demonstrated that changes in magnetic moments in both the magnitude and the direction within ferromagnetic layers can be determined by combining polarized neutron and resonant X-ray magnetic reflectometry, and those within antiferromagnetic layers, by combining X-ray and neutron diffractometry.
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