Abstract
The use of neutron and X-ray reflectivity and diffuse scattering experiments to study the structure of surfaces and interfaces is reviewed. A new method of obtaining model-independent surface density profiles from reflectivity data using anomalous X-ray reflectivity is presented, and some examples are given of diffuse scattering studies of rough solid surfaces and capillary wave fluctuations on liquid surfaces. Finally, the relative advantages and disadvantages of neutrons and X-rays for such measurements are discussed.
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