Abstract
The effect of chemical composition and external magnetic field on the Kβ/Kα intensity ratio and line-shape of some chromium compounds have been investigated using the energy dispersive X-ray fluorescence analysis. The measurements were done using the 22.69 keV photon energy and energy dispersive Si(Li) semiconductor detector. The samples are located in the external magnetic field of intensities 0.6 T and 1.2 T. The experimental results obtained for B = 0 are compared with other experimental and theoretical values. The results have shown that the X-ray Kβ/Kα intensity ratios, chemical shifts, asymmetry indices and full widths at half maximum (FWHM) values can change when irradiation is conducted in a magnetic field.
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