Comparison of weld residual stress measurement results in low alloy welds between X-ray diffraction and stress relief methods

Abstract

In this study, a comparison of weld residual stress measurements between the X-ray diffraction technique and the stress relief technique is performed with the focus on the effect of the thickness on the stress measurement results. As the difference in the thickness becomes smaller, the difference in the stress measurement results also becomes smaller. At the weld center, where the stress gradient is in the thickness direction, the difference in the thickness is not negligible. In other words, it is concluded that the X-ray diffraction method is advantageous because it can evaluate the unique stress generated only in the surface layer.