Abstract
In this study, a comparison of weld residual stress measurements between the X-ray diffraction technique and the stress relief technique is performed with the focus on the effect of the thickness on the stress measurement results. As the difference in the thickness becomes smaller, the difference in the stress measurement results also becomes smaller. At the weld center, where the stress gradient is in the thickness direction, the difference in the thickness is not negligible. In other words, it is concluded that the X-ray diffraction method is advantageous because it can evaluate the unique stress generated only in the surface layer.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.